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- 柴山,環樹 (シバヤマ,タマキ) https://www.lib.hokudai.ac.jp/dissertations/list/?FF=4&LANG=en&ACCN=1103603039
Title in Japanese | 高分解能電子顕微鏡法による半導体界面の微細構造解析に関する研究 |
Title in English | |
Year of conferral of degrees | 1991 |
Type of degree / Kind of academic degree | 1(課程博士) / 036(博士(工学)) |
Report number | 3039 |
Date of conferral of degrees | 1992-03-25 |
The primary examiner / A deputy examiner | 高橋,平七郎 / 石井,邦宜 長谷川,英機 武笠,幸一 |
Location | |
Call number | |
Comment | |
Summary | 3039_shibayama.pdf |