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  1. 柴山,環樹 (シバヤマ,タマキ)
    2. https://www.lib.hokudai.ac.jp/dissertations/list/?FF=4&LANG=en&ACCN=1103603039
    Title in Japanese高分解能電子顕微鏡法による半導体界面の微細構造解析に関する研究
    Title in English
    Year of conferral of degrees1991
    Type of degree / Kind of academic degree1（課程博士） / 036（博士(工学)）
    Report number3039
    Date of conferral of degrees1992-03-25
    The primary examiner / A deputy examiner高橋,平七郎 / 石井,邦宜　長谷川,英機　武笠,幸一
    Location
    Call number
    Comment
    Summary3039_shibayama.pdf