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- 橋詰,保 (ハシヅメ,タモツ) https://www.lib.hokudai.ac.jp/dissertations/list/?FF=4&LANG=en&ACCN=1201603905
Title in Japanese | 容量分光法によるGaAsおよびAlGaAsの深い準位の評価 |
Title in English | Deep Level Characterization of GaAs and AlGaAs by Capacitance Spectroscopy |
Year of conferral of degrees | 1990 |
Type of degree / Kind of academic degree | 2(論文博士) / 016(工学博士) |
Report number | 3905 |
Date of conferral of degrees | 1991-03-25 |
The primary examiner / A deputy examiner | 長谷川,英機 / 田頭,博昭 本間,利久 武笠,幸一 大野,英男 |
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