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- 吉田,俊幸 (ヨシダ,トシユキ) https://www.lib.hokudai.ac.jp/dissertations/list/?FF=4&LANG=en&ACCN=1103605529
Title in Japanese | 超高真空対応非接触容量-電圧法によるシリコンの清浄表面と不活性化表面の評価 |
Title in English | Ultrahigh Vacuum Contactless Capacitance-Voltage Characterization of Clean and Passivated Silicon Surfaces |
Year of conferral of degrees | 2000 |
Type of degree / Kind of academic degree | 1(課程博士) / 036(博士(工学)) |
Report number | 5529 |
Date of conferral of degrees | 2001-03-23 |
The primary examiner / A deputy examiner | 長谷川,英機 / 雨宮,好仁 酒井,洋輔 橋詰,保 |
Location | |
Call number | |
Comment | |
Summary | 5529_yoshida.pdf |