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- 石井,宏辰 (イシイ,ヒロタツ) https://www.lib.hokudai.ac.jp/dissertations/list/?FF=4&LANG=en&ACCN=1103603041
Title in Japanese | 光電子分光法によるIII-V族化合物半導体界面の評価 |
Title in English | Characterization of III-V Compound Semiconductor Interfaces by X-ray Photoelectron Spectroscopy |
Year of conferral of degrees | 1991 |
Type of degree / Kind of academic degree | 1(課程博士) / 036(博士(工学)) |
Report number | 3041 |
Date of conferral of degrees | 1992-03-25 |
The primary examiner / A deputy examiner | 長谷川,英機 / 田頭,博昭 福井,孝志 澤田,孝幸 |
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Summary | 3041_ishi.pdf |