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- 近江,弘和 (オオミ,ヒロカズ) https://www.lib.hokudai.ac.jp/dissertations/list/?FF=4&LANG=en&ACCN=1103104275
Title in Japanese | 経路確率法による Si (001) 微斜面におけるドメイン反転現象の微視的解析 |
Title in English | Microscopic Analysis of Current-Induced Conversion on Si (001) Vicinal Surface by the Path Probability Method |
Year of conferral of degrees | 1997 |
Type of degree / Kind of academic degree | 1(課程博士) / 031(博士(理学)) |
Report number | 4275 |
Date of conferral of degrees | 1998-03-25 |
The primary examiner / A deputy examiner | 和田,宏 / 徳永,正晴 八木,駿郎 伊土,政幸 根本,幸児 |
Location | 理学部・中央図書室 |
Call number | 1802 |
Comment | |
Summary | 4275_omi.pdf |