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  1. 近江,弘和 (オオミ,ヒロカズ)
  2. https://www.lib.hokudai.ac.jp/dissertations/list/?FF=4&LANG=en&ACCN=1103104275
    Title in Japanese経路確率法による Si (001) 微斜面におけるドメイン反転現象の微視的解析
    Title in EnglishMicroscopic Analysis of Current-Induced Conversion on Si (001) Vicinal Surface by the Path Probability Method
    Year of conferral of degrees1997
    Type of degree / Kind of academic degree1(課程博士) / 031(博士(理学))
    Report number4275
    Date of conferral of degrees1998-03-25
    The primary examiner / A deputy examiner和田,宏 / 徳永,正晴 八木,駿郎 伊土,政幸 根本,幸児
    Location理学部・中央図書室
    Call number1802
    Comment
    Summary4275_omi.pdf