北海道大学学位論文目録データベース 検索結果
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- 石川,靖彦 (イシカワ,ヤスヒコ) https://www.lib.hokudai.ac.jp/dissertations/list/?FF=4&LANG=en&ACCN=1103604423
| Title in Japanese | 走査トンネル顕微鏡およびX線光電子分光法によるIII-V族化合物半導体表面のその場観察 |
| Title in English | In-Situ Characterization of III-V Compound Semiconductor Surfaces by Scanning Tunneling Microscopy and X-ray Photoelectron Spectroscopy |
| Year of conferral of degrees | 1997 |
| Type of degree / Kind of academic degree | 1(課程博士) / 036(博士(工学)) |
| Report number | 4423 |
| Date of conferral of degrees | 1998-03-25 |
| The primary examiner / A deputy examiner | 福井,孝志 / 雨宮,好仁 酒井,洋輔 長谷川,英機 |
| Location | |
| Call number | |
| Comment | |
| Summary | 4423_ishikawa.pdf |
