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  1. 石川,靖彦 (イシカワ,ヤスヒコ)
    2. https://www.lib.hokudai.ac.jp/dissertations/list/?FF=4&LANG=en&ACCN=1103604423
    Title in Japanese走査トンネル顕微鏡およびX線光電子分光法によるIII-V族化合物半導体表面のその場観察
    Title in EnglishIn-Situ Characterization of III-V Compound Semiconductor Surfaces by Scanning Tunneling Microscopy and X-ray Photoelectron Spectroscopy
    Year of conferral of degrees1997
    Type of degree / Kind of academic degree1（課程博士） / 036（博士(工学)）
    Report number4423
    Date of conferral of degrees1998-03-25
    The primary examiner / A deputy examiner福井,孝志 / 雨宮,好仁　酒井,洋輔　長谷川,英機
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    Summary4423_ishikawa.pdf