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- 水江,千帆子 (ミズエ,チホコ) https://www.lib.hokudai.ac.jp/dissertations/list/?FF=4&LANG=en&ACCN=2011030218
Title in Japanese | MOS 型デバイス応用のための窒化ガリウム系へテロ構造界面の評価と制御 |
Title in English | Characterization and control of GaN-based heterostructure interfaces for MOS device applications |
Year of conferral of degrees | 2010 |
Type of degree / Kind of academic degree | 1(課程博士) / 036(博士(工学)) |
Report number | 9979 |
Date of conferral of degrees | 2011-03-24 |
The primary examiner / A deputy examiner | 橋詰,保 / 本久,順一 佐藤,威友 |
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Call number | |
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Summary | 9979_mizue.pdf |