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- 大山,公士 (オオヤマ,キミヒト) https://www.lib.hokudai.ac.jp/dissertations/list/?FF=4&LANG=en&ACCN=2010120010
Title in Japanese | 窒化ガリウム系半導体結晶及びMOS,界面構造の電子準位評価 |
Title in English | |
Year of conferral of degrees | 2010 |
Type of degree / Kind of academic degree | 1(課程博士) / 036(博士(工学)) |
Report number | 9751 |
Date of conferral of degrees | 2010-12-24 |
The primary examiner / A deputy examiner | 橋詰,保 / 佐野,栄一 佐藤,威友 |
Location | |
Call number | |
Comment | |
Summary | 9751_ooyama.pdf |